kw.\*:("Matriz Mueller")
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Measuring loss from polarization sensitivitySTOLZE, Gunnar.Laser focus world. 2001, Vol 37, Num 3, pp 113-118, issn 1043-8092, 4 p.Article
Polarization entropy transfer and relative polarization entropyBARAKAT, R.Optics communications. 1996, Vol 123, Num 4-6, pp 443-448, issn 0030-4018Article
Normal form for Mueller matrices in polarization opticsSRIDHAR, R; SIMON, R.Journal of modern optics (Print). 1994, Vol 41, Num 10, pp 1903-1915, issn 0950-0340Article
Canonical forms of depolarizing Mueller matricesOSSIKOVSKI, Razvigor.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2010, Vol 27, Num 1, pp 123-130, issn 1084-7529, 8 p.Article
Depolarizing Mueller matrices : how to decompose them?OSSIKOVSKI, R; ANASTASIADOU, M; BEN HATIT, S et al.Physica status solidi. A, Applications and materials science (Print). 2008, Vol 205, Num 4, pp 720-727, issn 1862-6300, 8 p.Conference Paper
Characterization of Mueller matrices in polarization opticsSANJAY KUMAR, M; SIMON, R.Optics communications. 1992, Vol 88, Num 4-6, pp 464-470, issn 0030-4018Article
Alternative depolarization criteria for Mueller matricesOSSIKOVSKI, Razvigor.Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2010, Vol 27, Num 4, pp 808-814, issn 1084-7529, 7 p.Article
Forward and reverse product decompositions of depolarizing Mueller matricesOSSIKOVSKI, Razvigor; DE MARTINO, Antonello; GUYOT, Steve et al.Optics letters. 2007, Vol 32, Num 6, pp 689-691, issn 0146-9592, 3 p.Article
Optimum angles for a polarimeter. II : Polarization analysis and measurementAMBIRAJAN, A; LOOK, D. C.Optical engineering (Bellingham. Print). 1995, Vol 34, Num 6, pp 1656-1658, issn 0091-3286Article
Nondipole light scattering by partially oriented ensembles. III: The Müller pattern for achiral macromoleculesDUAN TIAN; MCCLAIN, W. M.The Journal of chemical physics. 1989, Vol 91, Num 8, pp 4435-4439, issn 0021-9606, 5 p.Article
Analysis of systematic errors in Mueller matrix ellipsometry as a function of the retardance of the dual rotating compensatorsBROCH, Laurent; EN NACIRI, Aotmane; JOHANN, Luc et al.Thin solid films. 2011, Vol 519, Num 9, pp 2601-2603, issn 0040-6090, 3 p.Conference Paper
Potential uses of a Mueller polarimeter in the industryGEMINIANO MARTINEZ-PONCE, Geminiano.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8287, issn 0277-786X, isbn 978-0-8194-8934-0, 82870W.1-82870W.5Conference Paper
Evaluation of birefringence dispersion in hexagonal photonic fibers using Mueller matrix formalism and the Poincaré sphereTENTORI, Diana; TORRES-GOMEZ, Ismael.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7839, issn 0277-786X, isbn 978-0-8194-8360-7, 78391K.1-78391K.4Conference Paper
Experimental implementation and properties of Stokes nondiagonalizable depolarizing Mueller matricesOSSIKOVSKI, Razvigor; FALLET, Clément; PIERANGELO, Angelo et al.Optics letters. 2009, Vol 34, Num 7, pp 974-976, issn 0146-9592, 3 p.Article
Evolution of statistic moments of 2D-distributions of biological tissues Mueller matrix elements in the process of their birefringent structure changesUSHENKO, Yu. A; POPOVITCH, P. T; GODNYUK, S. V et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7388, issn 0277-786X, isbn 978-0-8194-7671-5 0-8194-7671-4, 73881N.1-73881N.9Conference Paper
Mueller-matrixes tomography of two-layer biological crystals networksDUBOLAZOV, A. V; MISEVITCH, I. Z; UNGURIAN, V. P et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7388, issn 0277-786X, isbn 978-0-8194-7671-5 0-8194-7671-4, 73881G.1-73881G.7Conference Paper
Reflective and polarimetric characteristics of urban materialsJONES, Douglas G; GOLDSTEIN, Dennis H; SPAULDING, Jonathan C et al.Proceedings of SPIE, the International Society for Optical Engineering. 2006, pp 62400A.1-62400A.10, issn 0277-786X, isbn 0-8194-6296-9, 1VolConference Paper
Metrics for depolarizationCHIPMAN, Russell A.SPIE proceedings series. 2005, pp 58880L.1-L58880L.10, isbn 0-8194-5893-7, 1VolConference Paper
The mueller matrix of a two-layer eccentrically bianisotropic cylinder linear array with double helical conductances of the surfaces : Clarification of the magnetic symmetry groups : AbstractYIN, W.-Y; LI, L.-W; YEO, T.-S et al.Journal of electromagnetic waves and applications. 2000, Vol 14, Num 8, pp 1135-1137, issn 0920-5071Article
A compact dual-crystal modulated birefringence-measurement system for microgravity applicationsMACKEY, J. R; DAS, K. K; ANNA, S. L et al.Measurement science & technology (Print). 1999, Vol 10, Num 10, pp 946-955, issn 0957-0233Article
Polarization diversity active imagingCLEMENCEAU, P; BREUGNOT, S; COLLOT, L et al.SPIE proceedings series. 1998, pp 284-291, isbn 0-8194-2829-9Conference Paper
Mueller matrices and depolarization criteriaSIMON, R.Optica acta. 1987, Vol 34, Num 4, pp 569-575, issn 0030-3909Article
The degree of mutual correlation of coordinate distributions of Mueller matrix elements biological tissues and diagnostics of their physiological stateTOMKA, Yuriy Ya; USHENKO, Alexander G; MARCHUK, Yu et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7388, issn 0277-786X, isbn 978-0-8194-7671-5 0-8194-7671-4, 73881K.1-73881K.10Conference Paper
Optimization of a snapshot Mueller matrix polarimeterLEMAILLET, Paul; RIVET, Sylvain; LE JEUNE, Bernard et al.Optics letters. 2008, Vol 33, Num 2, pp 144-146, issn 0146-9592, 3 p.Article
Snapshot Mueller matrix spectropolarimeterHAGEN, Nathan; OKA, Kazuhiko; DERENIAK, Eustace L et al.Optics letters. 2007, Vol 32, Num 15, pp 2100-2102, issn 0146-9592, 3 p.Article